[1]郭亨群,叶天水,曾锦川.硒化镉薄膜微区分析[J].华侨大学学报(自然科学版),1993,14(2):175-179.[doi:10.11830/ISSN.1000-5013.1993.02.0175]
Guo Hengqun,Ye Tianshui,Zeng Jinchuan.Microanalysis of CdSe Thin Films[J].Journal of Huaqiao University(Natural Science),1993,14(2):175-179.[doi:10.11830/ISSN.1000-5013.1993.02.0175]
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硒化镉薄膜微区分析(
)
《华侨大学学报（自然科学版）》[ISSN:1000-5013/CN:35-1079/N]
- 卷:
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第14卷
- 期数:
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1993年第2期
- 页码:
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175-179
- 栏目:
-
- 出版日期:
-
1993-04-20
文章信息/Info
- Title:
-
Microanalysis of CdSe Thin Films
- 作者:
-
郭亨群; 叶天水; 曾锦川
-
华侨大学电气技术系; 华侨大学电气技术系
- Author(s):
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Guo Hengqun; Ye Tianshui; Zeng Jinchuan
-
-
- 关键词:
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半导体薄膜; 微区分析; 硒化镉
- Keywords:
-
cadmium selenide; semiconductor film; microanalysis
- DOI:
-
10.11830/ISSN.1000-5013.1993.02.0175
- 摘要:
-
本文用电子探针对硒化镉薄膜进行微区分析,对薄膜的成分和厚度进行同时测定,并分析了制备条件对薄膜参数的影响。
- Abstract:
-
A Microanalysis of CdSe thin films was conducted with clectron prode.The con- stituent and thickness of the films were determined simultaneously.The influence of deposi- ting conditions on film parameters was analysed as well.
备注/Memo
- 备注/Memo:
-
福建省自然科学基金资助课题
更新日期/Last Update:
2014-03-22